Instantaneous phase-shift point-diffraction interferometer

James E. Millerd; Stephen J. Martinek; Neal J. Brock; John B. Hayes; James C. Wyant

doi:10.1117/12.557126

9 September 2004 Instantaneous phase-shift point-diffraction interferometer

James E. Millerd, Stephen J. Martinek, Neal J. Brock, John B. Hayes, James C. Wyant

Proceedings Volume 5380, Optical Data Storage 2004; (2004) https://doi.org/10.1117/12.557126
Event: Optical Data Storage Topical Meeting, 2004, Monterey, California, United States

Abstract

We demonstrate an instantaneous phase-shift, point diffraction interferometer that achieves high accuracy and is capable of measuring a single pulse of light at NA greater than 0.8.

Citation Download Citation

James E. Millerd, Stephen J. Martinek, Neal J. Brock, John B. Hayes, and James C. Wyant "Instantaneous phase-shift point-diffraction interferometer", Proc. SPIE 5380, Optical Data Storage 2004, (9 September 2004); https://doi.org/10.1117/12.557126

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