Paper
9 February 2005 Raman spectroscopy of annealed InAlAs quantum dots
Bin Wang, Xiaoxuan Xu, Yongchun Shu, Jianghong Yao, Zhangcheng Xu
Author Affiliations +
Abstract
Raman spectra of In0.65Al0.35As quantum dots (QDs) embedded between GaAlAs and GaP have been measured at room temperature. For the as-grown sample, in addition to the TO/LO modes from GaAs substrate, a weak broad peak appears from 165 cm-1 to 203 cm-1, corresponding to the interface mode of InAlAs QDs. The AlAs-like and GaP-like modes can be clearly seen at 382 cm-1. For the annealed samples, the AlAs and GaP-like modes disappeared, while the InAs-like modes become stronger, indicating strong intermixing between QDs and the matrix and the formation of uniform InGaAlAsP alloy.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bin Wang, Xiaoxuan Xu, Yongchun Shu, Jianghong Yao, and Zhangcheng Xu "Raman spectroscopy of annealed InAlAs quantum dots", Proc. SPIE 5635, Nanophotonics, Nanostructure, and Nanometrology, (9 February 2005); https://doi.org/10.1117/12.575539
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KEYWORDS
Raman spectroscopy

Quantum dots

Aluminum

Gallium arsenide

Annealing

Temperature metrology

Raman scattering

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