Dephasing of charge qubits in the presence of charge traps

Joo Chew Ang; Cameron J. Wellard; Lloyd C. L. Hollenberg

doi:10.1117/12.583197

23 February 2005 Dephasing of charge qubits in the presence of charge traps

Joo Chew Ang, Cameron J. Wellard, Lloyd C. L. Hollenberg

Proceedings Volume 5650, Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II; (2005) https://doi.org/10.1117/12.583197
Event: Smart Materials, Nano-, and Micro-Smart Systems, 2004, Sydney, Australia

Abstract

The feasibility of a charge based solid state quantum computing depends to a great extent on the ability to overcome the presence of noise sources such as Johnson noise in the gates and charge traps due to defects in the material. In this paper, we study the effects of dephasing from charge traps for the Si:P charge qubit.

Citation Download Citation

Joo Chew Ang, Cameron J. Wellard, and Lloyd C. L. Hollenberg "Dephasing of charge qubits in the presence of charge traps", Proc. SPIE 5650, Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II, (23 February 2005); https://doi.org/10.1117/12.583197

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