Paper
22 April 2005 Highly sensitive in-line fiber-optic structure for refractometric measurements
Blagoy Pantchev, Andrey Andreev, Parvaneh Danesh, Blagovesta Zafirova, E. Karakoleva, E. Vlaikova, Emilia Alipieva
Author Affiliations +
Proceedings Volume 5830, 13th International School on Quantum Electronics: Laser Physics and Applications; (2005) https://doi.org/10.1117/12.618775
Event: 13th International School on Quantum Electronics: Laser Physics and Applications, 2004, Bourgas, Bulgaria
Abstract
A refractometric structure consisting of a side-polished single-mode optical fiber covered with a thin film of hydrogenated amorphous silicon (a-Si:H) has been studied. a-Si:H films have been deposited by plasma-enhanced chemical vapour decomposition of silane. The sensors elements working with zero and first order optical modes of the amorphous silicon waveguide have been demonstrated. A high sensitivity of 5300 nm per unit refractive index has been obtained for the low values of superstrate refractive indices in the range of 1.33-1.38 by using a-Si:H film with a thickness of about 14 nm, i.e. the interaction with TE0 mode of the PWG. Despite of the very low thickness of the a-Si:H film there is no need of any additional layer protecting the structure from the analyzed medium. The mechanical and optical stability of the film and its very good adhesion to fused silica eliminate the possibility of the film damaging and makes the structure reliable in use.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Blagoy Pantchev, Andrey Andreev, Parvaneh Danesh, Blagovesta Zafirova, E. Karakoleva, E. Vlaikova, and Emilia Alipieva "Highly sensitive in-line fiber-optic structure for refractometric measurements", Proc. SPIE 5830, 13th International School on Quantum Electronics: Laser Physics and Applications, (22 April 2005); https://doi.org/10.1117/12.618775
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Refractive index

Sensors

Polarization

Chemical elements

Single mode fibers

Amorphous silicon

Fiber optics

Back to Top