Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width

V. V. Korchevskii; S. I. Klepikov; L. M. Popova

doi:10.1117/12.634055

8 June 2005 Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width

V. V. Korchevskii, S. I. Klepikov, L. M. Popova

Proceedings Volume 5851, Fundamental Problems of Optoelectronics and Microelectronics II; (2005) https://doi.org/10.1117/12.634055
Event: Fundamental Problems of Optoelectronics and Microelectronics II, 2004, Khabrovsk, Russian Federation

Abstract

Numerical methods have been applied for the estimation of a hardware error of x-ray methods caused heterogeeous characteristic x-rays. It is received, that this error depends on a corner of reflection, number of planes of reflection and wavelength. Dependences of diffraction line broadening owing to nonmonochromaticity from these parameters are resulted.

Citation Download Citation

V. V. Korchevskii, S. I. Klepikov, and L. M. Popova "Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width", Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); https://doi.org/10.1117/12.634055

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