On reliability of submicron and nanoelectronic devices

Angelica Bacivarov

doi:10.1117/12.639773

14 December 2005 On reliability of submicron and nanoelectronic devices

Angelica Bacivarov

Proceedings Volume 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II; 597219 (2005) https://doi.org/10.1117/12.639773
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 2004, Bucharest, Romania

Abstract

Although higher reliability is expected from submicron and nanotechnology so far only a few attempts have been made to apply reliability theory to submicron and nanodevices. The way to reliable nanotechnology is to identify relevant physical failure mechanisms and corresponding failure rates, determine reliability indices, and investigate reliability models down to nanoscale including quantum processes. Perhaps the most significant problem concerns the sensitivity of future IC generations face to various noise sources, and in patxularly face to energetic particles. This paper analyses some of the above problems. At the same time, we propose the implementation of a new soft error detecting technique based on time redundancy.

Citation Download Citation

Angelica Bacivarov "On reliability of submicron and nanoelectronic devices", Proc. SPIE 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 597219 (14 December 2005); https://doi.org/10.1117/12.639773

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