Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases

Peter Moeck; Ondřej Čertik; Bjoern Seipel; Rebecca Groebner; Lori Noice; Girish Upreti; Philip Fraundorf; Rolf Erni; Nigel D. Browning; Andreas Kiesow; Jean-Pierre Jolivet

doi:10.1117/12.629818

7 November 2005 Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases

Peter Moeck, Ondřej Čertik, Bjoern Seipel, Rebecca Groebner, Lori Noice, Girish Upreti, Philip Fraundorf, Rolf Erni, Nigel D. Browning, Andreas Kiesow, Jean-Pierre Jolivet

Author Affiliations +

Proceedings Volume 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III; 60000M (2005) https://doi.org/10.1117/12.629818
Event: Optics East 2005, 2005, Boston, MA, United States

Abstract

New needs to determine the crystallography of nanocrystals arise with the advent of science and engineering on the nanometer scale. Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution Z-contrast scanning TEM (Z-STEM), when combined with tools for image-based nanocrystallography possess the capacity to meet these needs. This paper introduces such a tool, i.e. fringe fingerprinting in two dimensions (2D), for the identification of unknown nanocrystal phases and compares this method briefly to qualitative standard powder X-ray diffractometry (i.e. spatial frequency fingerprinting). Free-access crystallographic databases are also discussed because the whole fingerprinting concept is only viable if there are comprehensive databases to support the identification of an unknown nanocrystal phase. This discussion provides the rationale for our ongoing development of a dedicated free-access Nano-Crystallography Database (NCD) that contains comprehensive information on both nanocrystal structures and morphologies. The current status of the NCD project and plans for its future developments are briefly outlined. Although feasible in contemporary HRTEMs and Z-STEMs, fringe fingerprinting in 2D (and image-based nanocrystallography in general) will become much more viable with the increased availability of aberration-corrected transmission electron microscopes. When the image acquisition and interpretation are, in addition, automated in such microscopes, fringe fingerprinting in 2D will be able to compete with powder X-ray diffraction for the identification of unknown nanocrystal phases on a routine basis. Since it possesses a range of advantages over powder X-ray diffractometry, e.g., fringe fingerprint plots contain much more information for the identification of an unknown crystal phase, fringe fingerprinting in 2D may then capture a significant part of the nanocrystal metrology market.

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Peter Moeck, Ondřej Čertik, Bjoern Seipel, Rebecca Groebner, Lori Noice, Girish Upreti, Philip Fraundorf, Rolf Erni, Nigel D. Browning, Andreas Kiesow, and Jean-Pierre Jolivet "Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases", Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 60000M (7 November 2005); https://doi.org/10.1117/12.629818

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