Paper
26 January 2006 A new driving method for LCoS with frame buffer pixels
Yulong Song, Zhihua Ling
Author Affiliations +
Proceedings Volume 6030, ICO20: Display Devices and Systems; 60300H (2006) https://doi.org/10.1117/12.667373
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
A new driving method for LCoS microdisplays with frame buffer pixels was developed here. The power dissipation of the LCoS microdisplays with frame buffer pixels is higher than that of the LCoS with DRAM-like pixels due to the twice samplings in LCoS with frame buffer pixels. In this paper, an adiabatic charging method was used to the second sampling of the frame buffer pixels in order to reduce the power dissipated in the transistors. The power dissipation of the second sampling was calculated when the power sources of the step, the ramp and the stair-step are used respectively. The conventional design adopted the step and contributed to high power and so result in more heat to deteriorate the device performance. The power dissipated in the transistors is almost zero if the ideal ramp source is used. The ramp can be the stair-step whose steps are infinity. The stair-step substitutes for the ramp due to easily generation and higher energy efficiency than the step. It can decrease the power dissipation of the LCoS panel and contributes to the heat reduction caused by power dissipation which can increase the microdisplay devices reliability. This method was developed based on the frame buffer pixel circuits which we proposed previously and can be applied to the others.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yulong Song and Zhihua Ling "A new driving method for LCoS with frame buffer pixels", Proc. SPIE 6030, ICO20: Display Devices and Systems, 60300H (26 January 2006); https://doi.org/10.1117/12.667373
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KEYWORDS
Liquid crystal on silicon

Capacitors

Transistors

Capacitance

Energy efficiency

Liquid crystals

Reliability

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