Paper
11 January 2007 A femtosecond electron diffraction system
Baosheng Zhao, Jie Zhang, Jinshou Tian, Junfeng Wang, Jianjun Wu, Yunquan Liu, Hulin Liu
Author Affiliations +
Proceedings Volume 6279, 27th International Congress on High-Speed Photography and Photonics; 62790V (2007) https://doi.org/10.1117/12.725112
Event: 27th International congress on High-Speed Photography and Photonics, 2006, Xi'an, China
Abstract
The femtosecond electron diffraction (FED) is a unique method for the study of the changes of complex molecular structures, and has been specifically applied in the investigations of transient-optics, opto-physics, crystallography, and other fields. The FED system designed by the present group, consists of a 35nm Ag photocathode evaporated on an ultraviolet glass, an anode with a 0.1mm aperture, two pairs of deflection plate for the deflection of electron beams in X and Y directions, and the Y deflection plate can be used as a scanning plate while measuring the pulse width of electron beams, the double MCPs detector for the enhancing and detecting of electron image. The magnetic lens was used for the focusing of the electron beams, and the focal length is 125mm. The distance between the object(the photocathode) and the image(the sample) is 503mm, and the size of electron beams is smaller than 17microns after focusing, the convergence angle is of -0.075~0.075°, and the temporal resolution is better than 350fs.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Baosheng Zhao, Jie Zhang, Jinshou Tian, Junfeng Wang, Jianjun Wu, Yunquan Liu, and Hulin Liu "A femtosecond electron diffraction system", Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62790V (11 January 2007); https://doi.org/10.1117/12.725112
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KEYWORDS
Electron beams

Diffraction

Femtosecond phenomena

Microchannel plates

Magnetism

Ultrafast phenomena

Field emission displays

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