Paper
29 January 2007 The measurement of micro-topography surface based on wave cutting interference theory
Mei Hui, Nian-mao Deng
Author Affiliations +
Proceedings Volume 6279, 27th International Congress on High-Speed Photography and Photonics; 62794V (2007) https://doi.org/10.1117/12.725460
Event: 27th International congress on High-Speed Photography and Photonics, 2006, Xi'an, China
Abstract
This paper proposes the measurement of micro-topography surface based on wave cutting interference theory. This wave cutting interference system realized the differential cutting and complex polarization with beam splitter polarize prism. Math model is established based on matrix analysis. The phase distribution is obtained with equation between intensity and phase from the figure of the light intensity information, the value of micro-topography surface is obtained after data manipulation. Some technical difficulties existed in the surface microscopy are analyzed and solved.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mei Hui and Nian-mao Deng "The measurement of micro-topography surface based on wave cutting interference theory", Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62794V (29 January 2007); https://doi.org/10.1117/12.725460
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Prisms

Polarization

Beam splitters

Mathematical modeling

Mathematics

Birefringence

Chemical elements

Back to Top