Error rate improvement of super-RENS random signal with the minimum mark length of 75nm in 405nm 0.85 NA system

Jaecheol Bae; Jooho Kim; Inoh Hwang; Hyunki Kim; Jinkyung Lee; Hyunsoo Park; Insik Park; Junji Tominaga

doi:10.1117/12.685237

22 June 2006 Error rate improvement of super-RENS random signal with the minimum mark length of 75nm in 405nm 0.85 NA system

Jaecheol Bae, Jooho Kim, Inoh Hwang, Hyunki Kim, Jinkyung Lee, Hyunsoo Park, Insik Park, Junji Tominaga

Author Affiliations +

Proceedings Volume 6282, Optical Data Storage 2006; 628217 (2006) https://doi.org/10.1117/12.685237
Event: Optical Data Storage 2006, 2006, Montréal, Canada

Abstract

We report the error rate improvement of super-resolution near field structure (Super-RENS) write-once read-many (WORM) disk at a blue laser optical system. (Laser wavelength 405nm, numerical aperture 0.85) We used a disk of which carrier level (CL) of 75nm is improved from -26.3 dBm to -19.0 dBm. We controlled the equalization (EQ) profile characteristics and used the adaptive 5 symbol write strategy and advanced high tap partial-response maximum likelihood (PRML) technique in order to improve the bit error rate (bER) characteristics of the super-RENS random signal. As a result, we obtained bER of 10^-4 level with new signal processing techniques and bit error analysis process. This result shows high feasibility of super-RENS technology for practical use in the near future.

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Jaecheol Bae, Jooho Kim, Inoh Hwang, Hyunki Kim, Jinkyung Lee, Hyunsoo Park, Insik Park, and Junji Tominaga "Error rate improvement of super-RENS random signal with the minimum mark length of 75nm in 405nm 0.85 NA system", Proc. SPIE 6282, Optical Data Storage 2006, 628217 (22 June 2006); https://doi.org/10.1117/12.685237

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