Second-order nonlinear thin film characterization using logarithmic Hilbert transform

Aydogan Ozcan

doi:10.1117/12.685158

2 October 2006 Second-order nonlinear thin film characterization using logarithmic Hilbert transform

Aydogan Ozcan

Proceedings Volume 6389, Active and Passive Optical Components for Communications VI; 63890Y (2006) https://doi.org/10.1117/12.685158
Event: Optics East 2006, 2006, Boston, Massachusetts, United States

Abstract

A new technique based on logarithmic Hilbert transform processing of Maker-fringe (MF) curves to characterize second-order optical nonlinear depth profile of thin films is described. Such characterization methods are important for several fields, for example to characterize the nonlinear coefficient profile of poled glass samples, which hold an important potential for fiber based nonlinear devices in telecommunication links. In the classical MF measurement system, a laser beam is focused onto the nonlinear film and the generated second-harmonic power is recorded vs. the laser incidence angle. The resulting MF curve is proportional to the square of the magnitude of the Fourier transform of the spatial profile d(z) of the nonlinear coefficient, where z is perpendicular to the film surface. Our new analytical method requires only the measurement of the MF curve of the nonlinear sample alone. It is based on the computation of the logarithmic Hilbert transform of the measured MF curve of the sample. Being analytical, this approach provides speed advantage over its iterative alternative. This new technique is verified experimentally with two germanosilicate-Infrasil structures, thermally poled at ~5 kV and 280° C in air. This choice of material was primarily made because germanosilicate films form excellent waveguides with a refractive index close to that of silica, which makes them compatible with fiber-optic technology. This is the first time that a Hilbert transform based analytical tool has been applied to uniquely characterize nonlinear thin films.

Citation Download Citation

Aydogan Ozcan "Second-order nonlinear thin film characterization using logarithmic Hilbert transform", Proc. SPIE 6389, Active and Passive Optical Components for Communications VI, 63890Y (2 October 2006); https://doi.org/10.1117/12.685158

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