Paper
5 March 2008 A new phase unwrapping algorithm using two digital phase-shifting gratings of different period for fringe projective 3D profile sensor
Jian Luo, Yi Wang, Ai Xiong, Jiahu Yuan
Author Affiliations +
Proceedings Volume 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing; 662324 (2008) https://doi.org/10.1117/12.791551
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
Fringe projective 3D profile sensor can obtain dense coordinates map of object outline fast and quantitatively. Phase unwrapping technique plays an important role in the performance of the sensor when phase-shifting fringe patterns are used. The multi-period phase shift method can considerably increase the accuracy of measuring phase value. However, due to error of intensity approximation arisen from digital grating and the spatial resolution limits on the projector and cameras of the senor, the result of unwrapped phase value is still within noise only by means of temporal phase-unwrapping. A new algorithm combining the spatial and temporal phase-unwrapping methods is presented. The algorithm, which is a good compromise between the number of needed gratings and the unwrapping reliability, is especially designed for using two groups of digital phase-shifting gratings with different period. Experiments have been carried out by selecting about thirty pairs of periods to illustrate the efficiency of temporal and spatial criterions, and the results offer the tolerance of phase calculation which is unwrapped correctly. The algorithm has been implemented on a test system, and the ratio of unwrapping successfully reaches to 80% with the repeated error 0.05 rad.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jian Luo, Yi Wang, Ai Xiong, and Jiahu Yuan "A new phase unwrapping algorithm using two digital phase-shifting gratings of different period for fringe projective 3D profile sensor", Proc. SPIE 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing, 662324 (5 March 2008); https://doi.org/10.1117/12.791551
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KEYWORDS
Reliability

Phase shifts

Projection systems

Cameras

Sensors

Fringe analysis

Phase measurement

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