Paper
18 July 2007 Spectroscopic imaging in the near field with an apertureless solid immersion lens microscope
T. Merz, R. W. Kessler
Author Affiliations +
Abstract
To achieve high lateral resolution in microscopy, we exploit the localized electromagnetic field of a Solid Immersion Lens (SIL). The lens is mounted on a cantilever of a Scanning Probe Microscope (SPM) to allow a dynamic scan with constant tip-sample force. This unit can be integrated into a micro fluorescence (Zeiss UMSP) or Raman spectrometer (Renishaw) to allow spectroscopy and spectrally resolved imaging in the near field. Three methods can be applied with a lateral resolution of less than 30 nm: 1) Reflectance-SNOM: the sample is imaged by illuminating the surface through the SIL and detecting the reflected near-field. 2) Photon-tunneling-SNOM: the contrast is generated by the ability of the photons to tunnel through the energy barrier into the substrate. 3) Fluorescence- SNOM: the chromophore is excited and the fluorescence light is collected by the SIL. The collection efficiency for the fluorescence is increased by a factor of 10 due to the high refractive index of the SIL compared to conventional methods.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Merz and R. W. Kessler "Spectroscopic imaging in the near field with an apertureless solid immersion lens microscope", Proc. SPIE 6631, Novel Optical Instrumentation for Biomedical Applications III, 66310V (18 July 2007); https://doi.org/10.1117/12.727812
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Near field scanning optical microscopy

Near field

Spectroscopy

Scanning probe microscopy

Luminescence

Microscopes

Solids

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