Calibration of CNC milling machine by direct method

Abdul Wahid Khan; Wuyi Chen

doi:10.1117/12.807066

2 February 2009 Calibration of CNC milling machine by direct method

Abdul Wahid Khan, Wuyi Chen

Proceedings Volume 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications; 716010 (2009) https://doi.org/10.1117/12.807066
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

Calibration refers to the system of quantity value determination of instruments, equipments and test devices according to industrial requirement, based on metrological characteristics. In present research critical parameter which affects the accuracy and product quality of a CNC milling machine, was investigated and quantified by using direct method. These parameters consist of position dependent or position independent parameters, like linear displacement errors, angular errors of linear axes, straightness error of linear axes and squareness error between the axes. Repeatability, lead screw and resolution error of the CNC milling machine were also quantified to provide additional information to the user, because in absence of this additional information a misconception persists causing a major contributor to the inaccuracy and quality of the product. Parameters were measured and quantified by using a laser interferometer and artifacts as working standards under controlled environmental conditions on a manufacturing CNC milling machine. Polynomial regression analyses were carried out for finding the coefficients to predict the errors at each and every desired position which is quite useful for compensation and enhancing the accuracy of a machine system. Machine accuracy detailed chart was also made to assess and assure the accuracy, capability or for accuracy monitoring of the CNC milling machine

Citation Download Citation

Abdul Wahid Khan and Wuyi Chen "Calibration of CNC milling machine by direct method", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716010 (2 February 2009); https://doi.org/10.1117/12.807066

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