Paper
4 February 2009 From blind to quantitative steganalysis
Author Affiliations +
Proceedings Volume 7254, Media Forensics and Security; 72540C (2009) https://doi.org/10.1117/12.805601
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
Abstract
Quantitative steganalyzers are important in forensic steganalysis as they can estimate the payload, or, more precisely, the number of embedding changes in the stego image. This paper proposes a general method for constructing quantitative steganalyzers from features used in blind detectors. The method is based on support vector regression, which is used to learn the mapping between a feature vector extracted from the image and the relative embedding change rate. The performance is evaluated by constructing quantitative steganalyzers for eight steganographic methods for JPEG files, using a 275-dimensional feature set. Error distributions of within- and between-image errors are empirically estimated for Jsteg and nsF5. For Jsteg, the accuracy is compared to state-of-the-art quantitative steganalyzers.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tomáš Pevny, Jessica Fridrich, and Andrew D. Ker "From blind to quantitative steganalysis", Proc. SPIE 7254, Media Forensics and Security, 72540C (4 February 2009); https://doi.org/10.1117/12.805601
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CITATIONS
Cited by 12 scholarly publications.
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KEYWORDS
Steganalysis

Error analysis

Forensic science

Current controlled current source

Electroluminescence

Electronic imaging

Feature extraction

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