High precision optical fiber fluorescent temperature measurement system and data processing

Yutian Wang; Xiaoxu Bo; Feifei Gui

doi:10.1117/12.885444

31 December 2010 High precision optical fiber fluorescent temperature measurement system and data processing

Yutian Wang, Xiaoxu Bo, Feifei Gui

Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75443Y (2010) https://doi.org/10.1117/12.885444
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China

Abstract

Generally, the theoretical analysis of the fluorescent life time temperature measurement is based on the assumption of the exponential life time characteristic, but in practice, the actual curve of the fluorescence are different from exponential. This is the key-influence on the stability of the high precision fluorescent measurement system. The differences are analyzed base on the theoretical mechanism of fluorescent, and a cutting and normalized method is given to describe the degree of the non-exponent of the actual fluorescent curve defer from the exponential curve. Several kinds of typical fluorescence materials spectrum and its cutting and normalized experiment results verify this theoretical analysis. Some effective measures to improve the non-exponent of the system are taken and are applied to a temperature measurement system based on actual fluorescent curve analysis with resolution 0.1°C, precisions ±0.2°C, and real-time calibration is carried on. Based the theory base and the actuality of fluorescence optical fiber temperature sensor, two methods about fluorescence decay time constant are proposed. In the mean time, the mathematic model has been formed and analysis, so that the different schemes are selected in different situation.

Citation Download Citation

Yutian Wang, Xiaoxu Bo, and Feifei Gui "High precision optical fiber fluorescent temperature measurement system and data processing", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443Y (31 December 2010); https://doi.org/10.1117/12.885444

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