Paper
31 December 2010 Modeling of CMM dynamic error based on optimization of neural network using genetic algorithm
Qu Ying, Luo Zai, Lu Yi
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75445Q (2010) https://doi.org/10.1117/12.885603
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
By analyzing the dynamic error of CMM, a model is established using BP neural network for CMM .The most important 5 input parameters which affect the dynamic error of CMM are approximate rate, length of rod, diameter of probe, coordinate values of X and coordinate values of Y. But the training of BP neural network can be easily trapped in local minimums and its training speed is slow. In order to overcome these disadvantages, genetic algorithm (GA) is introduced for optimization. So the model of GA-BP network is built up. In order to verify the model, experiments are done on the CMM of type 9158. Experimental results indicate that the entire optimizing capability of genetic algorithm is perfect. Compared with traditional BP network, the GA-BP network has better accuracy and adaptability and the training time is halved using GA-BP network. The average dynamic error can be reduced from 3.5μm to 0.7μm. So the precision is improved by 76%.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qu Ying, Luo Zai, and Lu Yi "Modeling of CMM dynamic error based on optimization of neural network using genetic algorithm", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75445Q (31 December 2010); https://doi.org/10.1117/12.885603
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KEYWORDS
Neural networks

Genetic algorithms

Error analysis

Data modeling

Optimization (mathematics)

Control systems

Statistical modeling

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