Multi-layer photonics modeling framework for the design, analysis, and optimization of devices, links, and networks

André Richter; Hadrien Louchet; Cristina Arellano; Jim Farina; Igor Koltchanov

doi:10.1117/12.878920

24 January 2011 Multi-layer photonics modeling framework for the design, analysis, and optimization of devices, links, and networks

André Richter, Hadrien Louchet, Cristina Arellano, Jim Farina, Igor Koltchanov

Author Affiliations +

Proceedings Volume 7959, Optical Metro Networks and Short-Haul Systems III; 79590L (2011) https://doi.org/10.1117/12.878920
Event: SPIE OPTO, 2011, San Francisco, California, United States

Abstract

Requirements on photonics modeling vary significantly when aiming to design, analyze and optimize a single device, a complete transmission link or a complex network. Depending on the task at hand, different levels of detail for emulating the underlying physical characteristics and signal interactions are necessary. We present a multi-layer photonics modeling framework that addresses the different design challenges of devices, links and networks. Our discussed methodology is based on flexible optical signal representations, equipment models ranging from very detailed to high-level parametric, sophisticated numerical algorithms and means for automated parameter and technology variation and optimization. We discuss applications such as the detailed modeling on photonics integrated circuit level, the characterization of a high-speed transmission link utilizing multilevel modulation and coherent detection, the parametric analysis of transmission links and network dynamics, and the cost-optimized placement of equipment in moderately complex networks.

Citation Download Citation

André Richter, Hadrien Louchet, Cristina Arellano, Jim Farina, and Igor Koltchanov "Multi-layer photonics modeling framework for the design, analysis, and optimization of devices, links, and networks", Proc. SPIE 7959, Optical Metro Networks and Short-Haul Systems III, 79590L (24 January 2011); https://doi.org/10.1117/12.878920

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