Paper
18 August 2011 Monte Carlo simulation for x-ray detector
Houzhi Cai, Jinyuan Liu, Xiang Peng, Lihong Niu, Wenda Peng, Jinghua Long
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Abstract
X-ray detector based on the gated microchannel plate (MCP) is a powerful diagnostic tool for laser-driven inertial confinement fusion and fast Z-pinch experiments. In order to understand the behavior of the MCP used in such detector, the X-ray detector is simulated using the Monte Carlo method. By simulating the electron cascade in the MCP, the relationship between the MCP gain and voltage is obtained. The time, position and energy of the electrons at the MCP output surface are calculated. The transit time distribution, the electron-channel wall collision number distribution and the time distribution of the electrons travel from the MCP to the phosphor screen are given. Spatial resolution simulations of the MCP-based detector are also presented.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Houzhi Cai, Jinyuan Liu, Xiang Peng, Lihong Niu, Wenda Peng, and Jinghua Long "Monte Carlo simulation for x-ray detector", Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81941D (18 August 2011); https://doi.org/10.1117/12.900137
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KEYWORDS
Microchannel plates

Monte Carlo methods

X-ray detectors

Spatial resolution

Sensors

Picosecond phenomena

Cameras

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