Paper
3 March 2012 Feasibility study of the sub-pixel scanning method for single-exposure x-ray refraction imaging by Talbot-Lau interferometer using an a-Se direct conversion type FPD
D. Murakoshi, T. Tada, H. Ishii, A. Hashimoto, Y. Kaneko, W. Ito, T. Agano
Author Affiliations +
Abstract
We propose a Sub-Pixel Scanning (SPS) method for imaging the refraction of X-rays by an object with a single exposure. The key feature of our SPS method is that the area where the G2 grating masks the self-image of the G1 grating cyclically changes along the several adjoining sub-pixels by means of G2 rotation with a predetermined angle to the selfimage. Thereby, periodically intensity-modulated signal can be acquired in a single exposure. This intensity-modulated signal nearly corresponds to that from the each phase step signal in the phase stepping method. Accordingly, a refraction image with the pixel size corresponding to the width of a sub-pixel set can be constructed by calculating the phase shift in each sub-pixel data set. An experimental equipment was designed and constructed using an amorphous Selenium (a-Se) direct conversion type Flat Panel Detector (FPD), to demonstrate the feasibility of the SPS method. An image acquired by SPS method was comparable to that of the image by phase stepping method with multiple exposure, where the imaging conditions, i.e. total imaging exposure dose and image resolution, are the same. We expect SPS method to contribute to the development of the practical imaging system in clinical diagnostic use.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Murakoshi, T. Tada, H. Ishii, A. Hashimoto, Y. Kaneko, W. Ito, and T. Agano "Feasibility study of the sub-pixel scanning method for single-exposure x-ray refraction imaging by Talbot-Lau interferometer using an a-Se direct conversion type FPD", Proc. SPIE 8313, Medical Imaging 2012: Physics of Medical Imaging, 83135G (3 March 2012); https://doi.org/10.1117/12.910886
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KEYWORDS
Refraction

X-rays

Surface plasmons

X-ray imaging

Imaging systems

Interferometers

Image retrieval

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