Three-dimensional grid algorithm for all-sky autonomous star identification

Wen-jun Yi; Hai-bo Liu; Jian-kun Yang; Hui Jia; Li-xin Yang

doi:10.1117/12.977625

15 October 2012 Three-dimensional grid algorithm for all-sky autonomous star identification

Wen-jun Yi, Hai-bo Liu, Jian-kun Yang, Hui Jia, Li-xin Yang

Proceedings Volume 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing; 842008 (2012) https://doi.org/10.1117/12.977625
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Grid algorithm is a classical star identification algorithm based on star pattern. A three-dimensional grid algorithm for all-sky autonomous star identification is proposed, which is associated with the information of star view magnitude. In contrast with traditional grid algorithm that constructs the grid cells on two-dimensional plane (e.g. x-y coordinate plane), the proposed approach makes use of the star view magnitudes of the neighboring stars as the third dimension (e.g. z-axis). A pattern is generated for each of its three-dimensional grid cells that contain neighboring star are 1, and those without are 0. The progress of star identification is to determine which pattern in the database is associated with the particular sensor pattern. Simulation shows that this method can achieve identification rate of 98.0% while the standard deviation of star position error and star view magnitudes are 1 pixel and 0.3Mv respectively. Compared with the traditional grid algorithm, the identification rate is higher, and the average runtime is 50 percent shorter.

Citation Download Citation

Wen-jun Yi, Hai-bo Liu, Jian-kun Yang, Hui Jia, and Li-xin Yang "Three-dimensional grid algorithm for all-sky autonomous star identification", Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 842008 (15 October 2012); https://doi.org/10.1117/12.977625

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available