Noise analysis for high speed CMOS image sensor

Zhi-qiang Guo; Li-yuan Liu; Jian Liu; Nan-jian Wu

doi:10.1117/12.2179448

13 April 2015 Noise analysis for high speed CMOS image sensor

Zhi-qiang Guo, Li-yuan Liu, Jian Liu, Nan-jian Wu

Proceedings Volume 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II; 95220V (2015) https://doi.org/10.1117/12.2179448
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held August-October 2014, 2014, China, China

Abstract

Noise performance of the high speed image sensor is a bottle neck for its low illumination applications. As the foremost stage circuit, pixel noise is an important portion of high speed image sensor system. This paper has discussed and analyzed the different noise source of the 4T pixel and influence on the image quality of high speed image sensor in detail. We proposed circuit model of pixel with ideal correlated double sampler to simulate the noise source distribution in the pixel and noise reducing methods. Pixel random readout noise can be effectively reduced to 5.44e by optimizing the gate size of the reset transistor.

Citation Download Citation

Zhi-qiang Guo, Li-yuan Liu, Jian Liu, and Nan-jian Wu "Noise analysis for high speed CMOS image sensor", Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95220V (13 April 2015); https://doi.org/10.1117/12.2179448

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