Presentation
5 March 2022 Non-destructive analysis of paintings by full field mid-IR tomography
A. Claude Boccara, Yannick De Wilde, Hugo Bourdon, Jean-Marie Chassot
Author Affiliations +
Proceedings Volume PC12008, Photonic Instrumentation Engineering IX; PC1200808 (2022) https://doi.org/10.1117/12.2606201
Event: SPIE OPTO, 2022, San Francisco, California, United States
Abstract
We propose to record "en face" Full Field OCT interferometric images of paintings on canvas using a cooled MCT camera working in the range 3-5.5 micrometers coupled to a glowbar broadband source that allows to reach shot noise limited detection. Penetration in various paints is spectacular at these large wavelengths: we measure a mean free path 5 to 10 times larger than at visible/near IR wavelengths. We find that the canvas is easily observed under the paint. This result, obtained without averaging, paves the way to a non-contact, non-destructive, more detailed analysis of paintings than existing IR techniques.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Claude Boccara, Yannick De Wilde, Hugo Bourdon, and Jean-Marie Chassot "Non-destructive analysis of paintings by full field mid-IR tomography", Proc. SPIE PC12008, Photonic Instrumentation Engineering IX, PC1200808 (5 March 2022); https://doi.org/10.1117/12.2606201
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KEYWORDS
Mid-IR

Nondestructive evaluation

Tomography

Cameras

Absorption

Interferometry

Multiple scattering

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