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17 March 2023 Tailored focal fields for the analysis of dipolar nano-emitters
Eileen Otte, Hyounghan Kwon, Nicholas A. Güsken, Niklas Arndt, Bart Jan Ravoo, Mark L. Brongersma
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Proceedings Volume PC12436, Complex Light and Optical Forces XVII; PC124360K (2023) https://doi.org/10.1117/12.2650590
Event: SPIE OPTO, 2023, San Francisco, California, United States
Abstract
If light interacts with media, it will naturally transform into structured light, spatially varying in its properties as amplitude, phase, and/or polarization and carrying information about the interacting medium. Going to the nano-regime, media information is typically hidden in the non-paraxial properties of light, including its 3D polarization states. However, with standard imaging techniques, this information is not directly accessible and stays invisible. We present how customized non-paraxial laser light fields can serve as a sophisticated tool for revealing hidden media information by selective dipole excitation. Additionally, we further advance our system by implementing a dielectric metasurface for information extraction.
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Eileen Otte, Hyounghan Kwon, Nicholas A. Güsken, Niklas Arndt, Bart Jan Ravoo, and Mark L. Brongersma "Tailored focal fields for the analysis of dipolar nano-emitters", Proc. SPIE PC12436, Complex Light and Optical Forces XVII, PC124360K (17 March 2023); https://doi.org/10.1117/12.2650590
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KEYWORDS
Dielectric polarization
3D metrology
Digital holography
Structured light
Dielectrics
Holography
Metrology
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