High-temperature-resistant gratings for moire interferometry

Colin Forno

doi:10.1117/12.195508

30 November 1994 High-temperature-resistant gratings for moire interferometry

Colin Forno

Proceedings Volume 2342, Interferometry '94: Photomechanics; (1994) https://doi.org/10.1117/12.195508
Event: International Conference on Interferometry '94, 1994, Warsaw, Poland

Abstract

A simple technique, based on metallized photoresist gratings, offers a method of using moire interferometry on components which are subjected to high temperatures. The approach has been used to measure residual stresses in components by the process of annealing.

Citation Download Citation

Colin Forno "High-temperature-resistant gratings for moire interferometry", Proc. SPIE 2342, Interferometry '94: Photomechanics, (30 November 1994); https://doi.org/10.1117/12.195508

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