Extending the application of subaperture finishing

Marc Tricard; Aric Shorey; Paul Dumas; Mike Demarco

doi:10.1117/12.676838

19 May 2006 Extending the application of subaperture finishing

Marc Tricard, Aric Shorey, Paul Dumas, Mike Demarco

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61501K (2006) https://doi.org/10.1117/12.676838
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

Subaperture polishing technologies have radically changed the landscape of precision optics manufacturing and enabled the production of components with higher accuracies and increasingly difficult figure requirements. Magnetorheological Finishing (MRF^®), for example, is a proven, production-worthy, deterministic, subaperture finishing technology that has excelled at extending precision finishing well beyond the limitations of traditional polishing. Several recent MRF developments will be presented, including the post polishing of Single Point Diamond Turned (SPDT) surfaces, transmitted wavefront correction, and finishing of increasingly large apertures. The high precision finishing of challenging optics using a newly developed jet-based technology will also be discussed. A series of examples spanning a wide range of materials, geometries and specifications will be presented. Specific areas to be discussed include the finishing of optics less than 5 mm in diameter, which typically require a very labor-intensive, iterative process to finish, and the correction of steeply concave optics, such as domes, which are typically not well suited for sub-aperture polishing processes.

Citation Download Citation

Marc Tricard, Aric Shorey, Paul Dumas, and Mike Demarco "Extending the application of subaperture finishing", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61501K (19 May 2006); https://doi.org/10.1117/12.676838

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