Paper
17 October 2008 Enhanced DCT2-based inverse mask synthesis with initial SRAF insertion
Author Affiliations +
Abstract
Inverse mask synthesis, or Inverse Lithography Technology, as a next generation resolution enhancement technology, is drawing pretty much attention after years of development. However, the existing optimized mask usually is too complex such that the pattern simplifying procedures have to be applied as a post processing step. But the post processing step may lead to pattern degradation and unwanted side lobe printing. In this paper, we first implement a new inverse mask synthesis system using two dimensional discrete cosine transform(DCT2) of the target mask, where the low frequency components are used in the optimization. As the high frequency components are discarded, the resulted optimal pattern is similar in shape to that of using the level set method in the published papers. Moreover, as inverse mask synthesis is an ill-posed problem, there are some local minimum locations. Previous algorithms usually use the desired pattern as an initial iteration point, in the sense that optimized pattern shall be a perturbation of the desired pattern. A common fact is that initial solution is critical to the optimization procedure and final result. In this paper, we apply an initial SRAF insertion around the main features before starting the existing inverse engine. The SRAF insertion does not need to be as accurate as that in the traditional SRAF+main feature OPC flow. Therefore, it does not add higher time burden on the whole mask synthesis flow. We implement the SRAF insertion based on computed mask electric field distribution. The experimental results show that using the initial fast SRAF insertion, the inverse engine is able to take advantage of a better initial high contrast image distribution, and the optimized pattern can be much simpler while the pattern fidelity is still in good control. We also observe that better optimized patterns can be achieved with fewer iterations.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shanhu Shen, Peng Yu, and David Z. Pan "Enhanced DCT2-based inverse mask synthesis with initial SRAF insertion", Proc. SPIE 7122, Photomask Technology 2008, 712241 (17 October 2008); https://doi.org/10.1117/12.801409
Lens.org Logo
CITATIONS
Cited by 12 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photomasks

SRAF

Lithography

Optical proximity correction

Binary data

Semiconducting wafers

Berkelium

RELATED CONTENT

Improvements of AIMS D2DB matching for product patterns
Proceedings of SPIE (July 09 2015)
New mask technology challenges
Proceedings of SPIE (September 05 2001)
The rising cost and complexity of RETs
Proceedings of SPIE (May 03 2004)
Reducing shot count through optimization-based fracture
Proceedings of SPIE (October 13 2011)
Alternatives to alternating phase-shift masks for 65 nm
Proceedings of SPIE (December 27 2002)

Back to Top