Dr. Amalia Martínez-García
Researcher at Centro de Investigaciones en Optica AC
SPIE Involvement:
Conference Program Committee | Author | Student Chapter Advisor
Area of Expertise:
Projected fringes , Digital holography , ESPI , Digital Image Correlation , Interferometry
Profile Summary

Amalia Martínez-García received her PhD in Optics at Centro de Investigaciones en Óptica (CIO), Mexico. She has been Visiting Researcher at Universidad de Santiago de Chile, School of Engineering at University of Basilicata, Potenza, Italy and Utsunomiya University, Japan. Currently, she is a researcher at CIO, member of the National System of Researchers (Level III), the Mexican Academy of Optics (AMO), the International Society of Optomechatronics (ISOT), the Society of Photo-Optical Instrumentation Engineers (SPIE), and the Optica (Formerly OSA). Her research interests focus on the field of optical metrology. She is the head of the Optical and Mechanical Testing Lab.
Publications (35)

Proceedings Article | 8 December 2022 Paper
Proceedings Volume 12480, 124800I (2022) https://doi.org/10.1117/12.2660184
KEYWORDS: Objectives, Blood, 3D displays, Phase shift keying, Light emitting diodes, Aluminum, Phase shifts, Interferometry, Thin films, Light sources

Proceedings Article | 3 September 2019 Paper
Proceedings Volume 11102, 111021I (2019) https://doi.org/10.1117/12.2528506
KEYWORDS: Graphene, Speckle pattern, Shearography, Composites, Polymers, Interferometry, Speckle

SPIE Journal Paper | 12 April 2017
Juan Rayas, Miguel León-Rodríguez, Amalia Martínez-García, Katia Genovese, Orlando Medina, Raúl Cordero
OE, Vol. 56, Issue 04, 044103, (April 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.4.044103
KEYWORDS: Fringe analysis, Beam splitters, Projection systems, Cameras, Phase shifts, Interferometers, Metrology, Calibration, Spherical lenses, Optical engineering

SPIE Journal Paper | 16 October 2015
OE, Vol. 54, Issue 10, 104110, (October 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.10.104110
KEYWORDS: Digital holography, Holograms, 3D image reconstruction, Image filtering, Optical filters, Linear filtering, Wavefronts, Holography, Gaussian filters, Image processing

Proceedings Article | 18 August 2014 Paper
Proceedings Volume 9204, 92040E (2014) https://doi.org/10.1117/12.2061840
KEYWORDS: Polarization, Temperature metrology, Phase shifting, Phase shifts, Interferometry, Fringe analysis, Phase interferometry, Michelson interferometers, Ronchi rulings, Charge-coupled devices

Showing 5 of 35 publications
Conference Committee Involvement (13)
Applied Optical Metrology VI
3 August 2025 | San Diego, California, United States
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
Interferometry and Structured Light 2024
21 August 2024 | San Diego, California, United States
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Showing 5 of 13 Conference Committees
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