Dr. Christos F. Karanikas
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 27 March 2014 Paper
Christos Karanikas, J. Taylor, Naveen Vaduri, Tafsirul Islam
Proceedings Volume 9051, 90511L (2014) https://doi.org/10.1117/12.2045908
KEYWORDS: Photoresist processing, Logic, Semiconducting wafers, Lithography, Image processing, Optical lithography, Critical dimension metrology, Line edge roughness, Diffractive optical elements, Etching

Proceedings Article | 29 March 2013 Paper
Sohan Singh Mehta, Craig Higgins, Vikrant Chauhan, Shyam Pal, Hui Peng Koh, Jean Raymond Fakhoury, Shaowen Gao, Lokesh Subramany, Salman Iqbal, Bumhwan Jeon, Pedro Morrison, Chris Karanikas, Yayi Wei, David Cho
Proceedings Volume 8682, 86820O (2013) https://doi.org/10.1117/12.2012331
KEYWORDS: Diffusion, Critical dimension metrology, Polymers, Photoresist processing, Image processing, Manufacturing, Lithography, Optical lithography, Data modeling, Modulation

Proceedings Article | 29 March 2013 Paper
Christos Karanikas, Jeong Soo Kim
Proceedings Volume 8682, 868227 (2013) https://doi.org/10.1117/12.2011209
KEYWORDS: Scanning laser ophthalmoscopy, Photoresist processing, Metals, Interfaces, Ions, Critical dimension metrology, Silicon, Semiconducting wafers, Semiconductors, Photoresist materials

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top