Ms. Dianne J. Coleman Profile

Dianne J. Coleman

Member of Technical Staff at Aerospace Corp

SPIE Involvement:

Author

Publications (11)

SPIE Journal Paper | 30 June 2018

Optical system contamination: formation of films and droplets

Kenneth Luey, Keith Olson, Dianne Coleman

JATIS, Vol. 4, Issue 03, 036001, (June 2018) https://doi.org/10.1117/12.10.1117/1.JATIS.4.3.036001

KEYWORDS: Contamination, Gold, Semiconducting wafers, Vacuum ultraviolet, Mirrors, Silicon, Microscopes, Head-mounted displays, Temperature metrology, Thin films

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SPIE Journal Paper | 4 January 2018

Optical system contamination: vacuum ultraviolet-modified surfaces

Kenneth Luey, Dianne Coleman

OE, Vol. 57, Issue 01, 015102, (January 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.1.015102

KEYWORDS: Vacuum ultraviolet, Semiconducting wafers, Contamination, Silicon, Lamps, Liquids, Scattering, Epoxies, Optical engineering, Wafer-level optics

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Proceedings Article | 15 October 2012 Paper

VUV modification of surfaces to induce film formation

Dianne Coleman, Kenneth Luey

Proceedings Volume 8492, 84920D (2012) https://doi.org/10.1117/12.931009

KEYWORDS: Vacuum ultraviolet, Silicon, Silicon films, Adhesives, Lamps, Oxides, Ultrasonics, Natural surfaces, Astronomical imaging, Analog electronics

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Proceedings Article | 8 September 2010 Paper

Contaminant film deposition on VUV-modified surfaces

Dianne Coleman, Kenneth Luey

Proceedings Volume 7794, 779409 (2010) https://doi.org/10.1117/12.860729

KEYWORDS: Silicon, Vacuum ultraviolet, Silicon films, Gold, Semiconducting wafers, Contamination, Molecules, Scattering, Aerospace engineering, Silicon carbide

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Proceedings Article | 2 September 2008 Paper

Photochemical processes in a two-component molecular contaminant film

Kenneth Luey, Dianne Coleman

Proceedings Volume 7069, 706903 (2008) https://doi.org/10.1117/12.793502

KEYWORDS: Vacuum ultraviolet, Molecules, Polymerization, Semiconducting wafers, Silicon, Contamination, Microscopes, Raman spectroscopy, Space operations, Photomicroscopy

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Proceedings Article | 7 September 2006 Paper

Digital imaging of particulate contamination

Kenneth Luey, David Taylor, Dianne Coleman, Kelsey Folgner

Proceedings Volume 6291, 62910J (2006) https://doi.org/10.1117/12.678560

KEYWORDS: Picture Archiving and Communication System, Digital imaging, Particles, Cameras, Contamination, Digital cameras, Calibration, Semiconducting wafers, Aerospace engineering, Image analysis

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Proceedings Article | 7 September 2006 Paper

Formation of contaminant droplets on surfaces

Kenneth Luey, Dianne Coleman

Proceedings Volume 6291, 62910G (2006) https://doi.org/10.1117/12.678563

KEYWORDS: Gold, Silicon, Silica, Vacuum ultraviolet, Platinum, Aluminum, Contamination, Scattering, Particles, Mirrors

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Proceedings Article | 15 October 2004 Paper

Optical properties of contaminant droplets

Kenneth Luey, Randy Villahermosa, Dianne Coleman

Proceedings Volume 5526, (2004) https://doi.org/10.1117/12.558223

KEYWORDS: Light scattering, Scattering, Polishing, Silicon, Particles, Aluminum, Silica, Optical properties, Surface finishing, Metals

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Proceedings Article | 30 May 2003 Paper

Degradation of a multilayer dielectric filter as a result of simulated space environmental exposure

Peter Fuqua, Nathan Presser, James Barrie, Michael Meshishnek, Dianne Coleman

Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.474853

KEYWORDS: Coating, Dielectrics, Dielectric filters, Multilayers, Particles, Laser induced damage, Silicon, Scanning electron microscopy, Plasma, Photomicroscopy

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