Dr. Dirk Ortloff Profile

Dr. Dirk Ortloff

Product Manager XperiDesk

SPIE Involvement:

Author

Area of Expertise:

development methodologies , process development , information management , information governance , collaboration tools

Websites:

Company Website | Personal Website

Dr. Dirk Ortloff co-founded Process Relations in 2007 - a software and service company offering solutions supporting the area of fabrication process development. He has specialised in process development technology and product engineering for high-tech industries within the semiconductor, photovoltaic and thin film manufacturing sectors. Prior to his engagement at Process Relations, he was ICT & PE Manager at Cavendish Kinetics and System Analyst at T-Systems GEI, he was also a Project Manager at Toll Collect. In 1995 he received his diploma in computer science from the University of Dortmund and undertook a doctorate in 2006 about XperiLink, one of the modules of XperiDesk offered by Process Relations.

Proceedings Article | 29 August 2019 Paper

Applying big data technologies to high tech manufacturing

Dirk Ortloff, Nils Knoblauch

Proceedings Volume 11177, 111770Q (2019) https://doi.org/10.1117/12.2535589

KEYWORDS: Data modeling, Manufacturing, Databases, Data analysis, Statistical analysis, Analytics, Visualization, Chemical vapor deposition, Printed circuit board testing, Principal component analysis

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The systematic analysis of ever-increasing data collection presents companies with ever-greater challenges. Many manufacturing organizations simply lack the know-how to handle Big Data projects and the corresponding data analysis right. Therefore one simply follows the current trends and buzz words and adopts approaches which are currently en vogue. This approach often leads to less successful projects and several regularly reoccurring patterns of misconceptions can be identified. This paper highlights some of these unsuccessful patterns and introduces some of the work done in the PRO-OPT SMART-DATA research project. The innovation in this data analysis approach is the combination of traditional statistical methods with new Big Data and AI analysis techniques applied to high tech manufacturing. Being able to align process data with the complete metrology data provides amazing new insights into the manufacturing. Furthermore, we will introduce a new visualization technique specifically suited for domains with high amounts of categorical data like semiconductor, photovoltaics, electronics and such. This paper will show how the combination of the statistical data analysis system Cornerstone in conjunction with Apache Spark1 and Apache Cassandra2 provides a good basis for engineering analytics of massive data amounts. By properly nesting the solid mathematical methods in Cornerstone with big data-appropriate infrastructure such as Apache Spark and, in our case, Apache Cassandra, many new analytics issues can be addressed. Analyzes that used to be inefficient due to the sheer volume of data in classically modeled schema’s can now be performed through appropriate big-table modeling and provide the ability to provide completely new insights into production data. Those directly impacted the manufacturing procedures and improved the products quality and reliability. Experiences gained in the project impacted the upcoming VDI/VDE guideline 37143 to be published later in the year 2019.

Proceedings Article | 15 February 2011 Paper

MEMS product engineering: methodology and tools

Dirk Ortloff, Jens Popp, Thilo Schmidt, Kai Hahn, Matthias Mielke, Rainer Brück

Proceedings Volume 7926, 79260D (2011) https://doi.org/10.1117/12.876104

KEYWORDS: Microelectromechanical systems, Manufacturing, 3D modeling, Product engineering, Computer aided design, Excel, Instrument modeling, Data acquisition, Prototyping, Data modeling

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Proceedings Article | 31 March 2010 Paper

Comprehensive design and process flow configuration for micro and nano tech devices

Kai Hahn, Thilo Schmidt, Matthias Mielke, Dirk Ortloff, Jens Popp, Rainer Brück

Proceedings Volume 7646, 76461F (2010) https://doi.org/10.1117/12.847583

KEYWORDS: Product engineering, Molecular nanotechnology, Computer aided design, Microelectromechanical systems, Manufacturing, Software development, 3D modeling, Instrument modeling, Process engineering, Virtual colonoscopy

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Proceedings Article | 21 August 2009 Paper

Environment for thin-film manufacturing process development for product engineering of micro and nano devices

Dirk Ortloff, Kai Hahn, Jens Popp, Thilo Schmidt, Rainer Brück

Proceedings Volume 7402, 74020N (2009) https://doi.org/10.1117/12.825606

KEYWORDS: Product engineering, Molecular nanotechnology, Manufacturing, Microelectromechanical systems, Custom fabrication, Fabrication, Process engineering, Data processing, CMOS technology, Control systems

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Proceedings Article | 30 December 2008 Paper

MEMS product engineering using fabrication process development tools

K. Hahn, T. Schmidt, D. Ortloff, J. Popp, A. Wagener, R. Brück

Proceedings Volume 7269, 72690W (2008) https://doi.org/10.1117/12.807705

KEYWORDS: Microelectromechanical systems, Product engineering, Manufacturing, Computer aided design, Data modeling, Environmental management, Process engineering, Data processing, Custom fabrication, Interfaces

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Proceedings Article | 7 March 2007 Paper

Verification of thin film processes in a virtual fabrication environment

T. Schmidt, D. Ortloff, J. Popp, K. Hahn, R. Brück, A. Hössinger

Proceedings Volume 6462, 64620G (2007) https://doi.org/10.1117/12.700379

KEYWORDS: Microelectromechanical systems, Virtual reality, Materials processing, Thin films, Device simulation, 3D modeling, Prototyping, Etching, Manufacturing, Data processing

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Proceedings Article | 21 April 2006 Paper

Management and verification for MEMS fabrication processes

T. Schmidt, D. Ortloff, K. Hahn, A. Wagener, J. Popp, R. Brück

Proceedings Volume 6186, 61860S (2006) https://doi.org/10.1117/12.661919

KEYWORDS: Microelectromechanical systems, Materials processing, Fabrication, Process modeling, Manufacturing, Silicon, Device simulation, Environmental management, Process engineering, Photomasks

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Proceedings Article | 23 January 2006 Paper

Process design and tracking support for MEMS

A. Wagener, T. Schmidt, J. Popp, K. Hahn, R. Brück, D. Ortloff

Proceedings Volume 6109, 610908 (2006) https://doi.org/10.1117/12.644486

KEYWORDS: Microelectromechanical systems, Data storage, Data processing, Databases, Semiconducting wafers, Structural design, Process modeling, Environmental management, Prototyping, Interfaces

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