Prof. Federico Sciammarella Profile

Prof. Federico Sciammarella

Assistant Professor at Northern Illinois Univ

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 7 March 2006 Paper

Heisenberg principle applied to fringe analysis

Cesar Sciammarella, Federico Sciammarella

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498381

KEYWORDS: Modulation, Fourier transforms, Fringe analysis, Moire patterns, Raster graphics, CCD cameras, Phase shift keying, Holography, Data processing, Data analysis

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SPIE Journal Paper | 1 September 2005

High-accuracy contouring using projection moiré

Cesar Sciammarella, Luciano Lamberti, Federico Sciammarella

OE, Vol. 44, Issue 09, 093605, (September 2005) https://doi.org/10.1117/12.10.1117/1.2044847

KEYWORDS: Teeth, Optical testing, Photogrammetry, Calibration, Cameras, 3D modeling, Optical engineering, Mathematical modeling, Projection systems, Data modeling

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SPIE Journal Paper | 1 May 2003

Measurement of mechanical properties of materials in the micrometer range using electronic holographic moire

Cesar Sciammarella, Federico Sciammarella

OE, Vol. 42, Issue 05, (May 2003) https://doi.org/10.1117/12.10.1117/1.1566004

KEYWORDS: Speckle pattern, Holography, Fourier transforms, Speckle, Interferometers, Polarization, Visibility, Microscopes, Speckle interferometry, CCD cameras

Proceedings Article | 13 June 2001 Paper

Electronic holographic moire in the micron range

Cesar Sciammarella, Federico Sciammarella

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429582

KEYWORDS: Holography, Particles, Speckle, Moire patterns, Holographic interferometry, Microscopy, Spatial resolution, Visibility, Statistical analysis, Composites

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Proceedings Article | 6 July 1998 Paper

Extension of electronic speckle correlation interferometry to large deformations

Cesar Sciammarella, Federico Sciammarella

Proceedings Volume 3479, (1998) https://doi.org/10.1117/12.316456

KEYWORDS: Fourier transforms, Speckle, Interferometry, Polarization, Sensors, Microscopes, Particles, Fringe analysis, Holography, Fiber optics

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