Dr. Haoyu Wang Profile

Dr. Haoyu Wang

at Univ of Shanghai for Science and Technology

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 28 February 2021 Paper

Method for estimating waveband of achromatic systems

Qiyuan Zhang, Haoyu Wang, Sen Han

Proceedings Volume 11781, 1178118 (2021) https://doi.org/10.1117/12.2591139

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Proceedings Article | 18 November 2019 Paper

Transmission measurement by using different wavelengths than designed wavelength

Sen Han, Qiyuan Zhang, Haoyu Wang, Yan Wang

Proceedings Volume 11189, 1118907 (2019) https://doi.org/10.1117/12.2539229

KEYWORDS: Wavefronts, Wavefront aberrations, Optical testing, Zernike polynomials, Interferometers, Zemax, MATLAB

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Testing wavefront distortions at the design wavelength is critical for optical system qualification. Existing technologies and methods for measuring transmitted wavefronts typically operate at only a few specific wavelengths. In previous research, we propose a method for estimating the wavefront distortion of an optical transmission system in a broad bandwidth. We establish the relationship between the transmitted wavefront and wavelength, using Zernike fringe coefficients to represent the wavefront. We have also experimentally tested a single lens represents the monochromatic transmission system at four wavelengths with interferometers. The results show the monotonic Zernike-wavelength curves of in 400~1000nm bandwidth can be predicted by fitted Conrady formula with three data points. In this paper, we further test a doublet achromatic lens at five wavelengths with interferometers, and we find most Zernike-wavelength curves of the doublet achromatic lens are still monotonic, which can solved by binomial Conrady formula with two data points. Using three points to fit Conrady formula for part of monotonic curves is the same as using two points to solve binomial Conrady formula. However the Z8- wavelength curve which have an inflection point must solved by Conrady formula with three data points. The experimental results of achromatic system are more representative, it shows that Zernike-wavelength curve of achromatic system can be expressed by Conrady formula. In practice testing, if the wavefronts measuring at different wavelengths are accurate, the wavefront of arbitrarily wavelength in a certain band can be estimated by solving Conrady formula. Our experiment shows that the Conrady formula can represent the dispersion characteristics of some optical systems, especially for achromatic system. And the feasibility of measuring transmitted wavefront in a certain band based on Zernike coefficient is verified. The new method will help to simplify the process of multi-wavelength interferometric measurements.

Proceedings Article | 12 December 2018 Paper

Pushing cavities to the edge for future gravitational wave detectors

Haoyu Wang, Miguel Dovale-Alvarez, Christopher Collins , Daniel David Brown , Mengyao Wang, Conor Mow-Lowry, Sen Han, Andreas Freise

Proceedings Volume 10847, 108470N (2018) https://doi.org/10.1117/12.2505394

KEYWORDS: Mirrors, Sensors, Interferometers, Nonuniformity corrections, Laser beam diagnostics, Gaussian beams, Laser stabilization, Control systems, Coating, Beam shaping

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Proceedings Article | 6 November 2018 Paper

Method for calibrating transmitted wavefront at any wavelength by refractive index formula

Qiyuan Zhang, Sen Han, Haoyu Wang, Quanzhao Wang

Proceedings Volume 10819, 108191Z (2018) https://doi.org/10.1117/12.2511225

KEYWORDS: Wavefronts, Calibration, Zernike polynomials, Refractive index, Optical testing, Glasses, Interferometers, Monochromatic aberrations, Zemax, Colorimetry

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Conference Committee Involvement (7)

Optical Metrology and Inspection for Industrial Applications XII

11 October 2025 | Beijing, China

Optical Metrology and Inspection for Industrial Applications XI

12 October 2024 | Nantong, Jiangsu, China

Optical Metrology and Inspection for Industrial Applications X

15 October 2023 | Beijing, China

Optical Metrology and Inspection for Industrial Applications IX

5 December 2022 | Online Only, China

Optical Metrology and Inspection for Industrial Applications VIII

11 October 2021 | Nantong, JS, China

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