Inpyo Kim
at SK Hynix Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 October 2021 Presentation + Paper
Proceedings Volume 11855, 118550Z (2021) https://doi.org/10.1117/12.2600926
KEYWORDS: Data modeling, Calibration, Photomasks, Process modeling, Statistical modeling, Scanning electron microscopy, Metrology, Critical dimension metrology, Error analysis

Proceedings Article | 8 June 2010 Paper
Sunghyun Oh, DaeHo Hwang, Inpyo Kim, Changreol Kim, Aviram Tam, Michael Ben Yishai, Yulian Wolff
Proceedings Volume 7748, 774827 (2010) https://doi.org/10.1117/12.869574
KEYWORDS: Inspection, Photomasks, SRAF, Defect detection, Image resolution, Critical dimension metrology, Airborne remote sensing, Artificial intelligence, Optics manufacturing, Signal detection

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