Dr. Iaroslav Gnilitskyi Profile

Dr. Iaroslav Gnilitskyi

at Univ degli Studi di Modena e Reggio Emilia

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 4 March 2019 Presentation

Highly regular LIPSS: Physical considerations and industrial applications (Conference Presentation)

Leonardo Orazi, Iaroslav Gnilitskyi, Nadezha Bulgakova, Tomáš Mocek

Proceedings Volume 10906, 1090610 (2019) https://doi.org/10.1117/12.2515553

Read Abstract +

In the last years LIPSS based processes leap from the research laboratories to industrial applications, in particular for tribology, polymer mold texturing, colorizing and enhanced biocompatibility. Despite of these applications not all the phenomena underlying LIPSS generation were understood and a comprehensive model to explain all the cases is generally accepted. In this work a phenomenological explanation of the level of regularity achievable when patterning different materials is proposed and discussed. In particular the regularity is correlated to the ratio between the laser wavelength and the decay length of the surface electromagnetic waves induced on the metallic surfaces. Regularity is measured by means of an original parameter, the Dispersion of the LIPSS Orientation Angle (DLOA). DLOA is calculated for different materials and parameters obtained both from original experiments and from literature and the results are the basis of the phenomenological model presented in the work. In the model the effects of the material dielectric permittivity and its dependency by time immediately after the irradiation are simulated and the effects of spot size is critically discussed.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years