Dr. Jinchun Wang Profile

Dr. Jinchun Wang

at Luoyang Optoelectro Technology Development Center

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 5 November 2020 Paper

Inductively coupled plasma (ICP) dry etching of type II InAs/GaSb superlattice for focal plane arrays

Fei Tao, Xubo Zhu, JinChun Wang, Yingjie He, Jiaxin Ding, Guansheng Yao, Lixue Zhang, Xiancun Cao, Yanqiu Lv

Proceedings Volume 11565, 115650I (2020) https://doi.org/10.1117/12.2575638

KEYWORDS: Etching, Chlorine, Superlattices, Dry etching, Gallium antimonide, Sensors, Staring arrays, Plasma etching, Wet etching

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Proceedings Article | 12 December 2018 Paper

Design of flexible small pixel readout integrated circuit (ROIC) with high input charge handling ability

Jinchun Wang, Weifeng Sun, Yanqiu Lv, Qi Liu, Yongbian Kuang

Proceedings Volume 10846, 1084602 (2018) https://doi.org/10.1117/12.2502045

KEYWORDS: Readout integrated circuits, Capacitance, Sensors, Amplifiers, Digital electronics, Analog electronics, Staring arrays, Integrated circuit design, Digital electronic circuits, Signal detection

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Proceedings Article | 25 October 2016 Paper

Study on defective elements from indium bump preparation in focal plane array fabrication

Zhijin Hou, Li Fu, Junjie Si, Wei Wang, Yanqiu Lv, Zhengxiong Lu, Jinchun Wang

Proceedings Volume 10157, 101570M (2016) https://doi.org/10.1117/12.2244506

KEYWORDS: Indium, Staring arrays

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Proceedings Article | 11 September 2013 Paper

Fabrication and performance of 1×128 linear PbS infrared focal plane array

Zhi-jin Hou, Jun-jie Si, Wei Wang, Yan-qiu Lv, Jin-chun Wang, Xiang-wei Chen

Proceedings Volume 8907, 890724 (2013) https://doi.org/10.1117/12.2032925

KEYWORDS: Sensors, Lead, Chemical elements, Infrared radiation, Staring arrays, Infrared sensors, Resistance, Infrared detectors, Readout integrated circuits, Control systems

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Proceedings Article | 8 September 2011 Paper

Research on bad pixel variation of IRFPA by high temperature storage and temperature shock

Wei Wang, Yang-yu Fan, Yue-nong Fu, Jin-chun Wang, Wei Wu, Jing Wang, Qiang Guo, Jun-ming Liu

Proceedings Volume 8193, 819328 (2011) https://doi.org/10.1117/12.900297

KEYWORDS: Sensors, Diodes, Manufacturing, Reliability, Readout integrated circuits, Infrared imaging, Analytical research, Imaging systems, Capacitors, Infrared radiation

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