A dual-frequency laser interferometer is established based on a frequency-stabilized 543.5nm Zeeman He-Ne laser. The
interferometer has been tested in displacement measuring experiments in comparison with a commercial 632.8nm dualfrequency
laser interferometer. Test results show that the achieved stability and the accuracy of the dual-frequency green
laser interferometer have reached the level in commercial dual-frequency interferometers. Apart from being capable in
heterodyne interferometry as a single-wavelength interferometer, the 543.5nm dual-frequency interferometer is also
promising in two-wavelength interferometry when combined with the commercial 632.8nm dual-frequency
interferometer, where both a high resolution and a relatively large range in displacement measurement can be achieved.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.