Karim S. Hedayet
at Si-Ware Systems
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 February 2020 Paper
Proceedings Volume 11293, 112930T (2020) https://doi.org/10.1117/12.2543803
KEYWORDS: Spectroscopy, Microelectromechanical systems, FT-IR spectroscopy, Compressed sensing, Spectral resolution, Infrared spectroscopy, Resolution enhancement technologies, Optical filters, Tunable lasers, Fourier transforms

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