Dr. Maria Jose Cadena Vinueza
at Bruker Corp
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 21 November 2023 Presentation + Paper
Proceedings Volume 12751, 1275106 (2023) https://doi.org/10.1117/12.2686868
KEYWORDS: Extreme ultraviolet, Contamination, Photomasks, Atomic force microscopy, Mask cleaning, Particles, Autoregressive models, Error analysis, Statistical analysis, Metrology

Proceedings Article | 29 September 2023 Paper
Proceedings Volume 12915, 1291503 (2023) https://doi.org/10.1117/12.2684791
KEYWORDS: Extreme ultraviolet, Atomic force microscopy, Particles, Photomasks, Mask cleaning, Autoregressive models, Ruthenium, Contamination, Printing

Proceedings Article | 1 December 2022 Presentation + Paper
Proceedings Volume 12293, 1229304 (2022) https://doi.org/10.1117/12.2641799
KEYWORDS: Extreme ultraviolet, Atomic force microscopy, Particles, Photomasks, Scanning electron microscopy, Nanotechnology, Ruthenium, Manufacturing, Deep ultraviolet, Optical lithography

Proceedings Article | 13 October 2020 Poster + Presentation + Paper
Proceedings Volume 11518, 1151811 (2020) https://doi.org/10.1117/12.2573094
KEYWORDS: Chemistry, Molecular machines, Extreme ultraviolet

Proceedings Article | 13 October 2020 Presentation + Paper
Proceedings Volume 11518, 115180C (2020) https://doi.org/10.1117/12.2573093
KEYWORDS: Nanotechnology, Photomasks, Edge detection, Edge roughness

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top