Dr. Mark J. McCollum Profile

Dr. Mark J. McCollum

Sr. Process Engineering Manager

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Publications (1)

Proceedings Article | 26 May 1994 Paper

Correlation of optical, x-ray, and electron microscopy measurements on semiconductor multilayer structures

David Christensen, Robert Hickernell, David Schaafsma, Joseph Pellegrino, Mark McCollum, James Hill, R. Rai

Proceedings Volume 2141, (1994) https://doi.org/10.1117/12.176851

KEYWORDS: Quantum wells, Reflectivity, Mirrors, Reflectors, X-rays, Vertical cavity surface emitting lasers, Reflectance spectroscopy, Remote sensing, X-ray optics, Refractive index

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