To allow for fast, automated inspection of checked baggage with low false alarm rates, we designed and built a novel X-ray diffraction (XRD) system to use in a hybrid CT+XRD configuration, where each bag is scanned by both CT and XRD systems. Our XRD system is modular, vendor agnostic, and operates inline with the CT system at belt speed with full-tunnel coverage. In this work, we demonstrate reduced false alarm rates (relative to CT alone) with our XRD system placed inline and integrated mechanically and via software with a Smiths CTX 5800 (a certified EDS system) for fully-automated material-based alarm decisions.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.