In view of the fact that the current research of detection technology for large-size grating surface defect was very little, this paper builds a set of grating defect detection device based on the principle of darkfield imaging. The scheme includes three subsystems: displacement system, monochrome light illumination system and image acquisition system. When the displacement system drives the motion stage to move, the monochromatic light illumination system and the image acquisition system jointly complete the acquisition of the grating surface images. In this study, the surface of the diffraction grating with 170×170mm2 was detected for defects, and the statistical data of different defects is given. Experimental results show that, the device meets the needs of defect detection and evaluation on large-size grating surfaces and the mechanical structure is simple and compact, which has the great potential for large-scale detection.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.