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Merve Uysal
at ASELSAN AS
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 13 June 2023 Presentation + Paper
CdZnTe wafer processing technology at ASELSAN Inc.
H. Eroglu, M. Uysal, B. Asici, Y. Ergunt
Proceedings Volume 12534, 125340S (2023) https://doi.org/10.1117/12.2663762
KEYWORDS: Cadmium telluride, Semiconducting wafers, Polishing, Surface finishing, Surface roughness, Particles, Mercury cadmium telluride, Image processing, Histograms, Optical interferometry, Image analysis
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