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Michael R. Douglass
Quality and Reliability Engineering Mgr - Retired
SPIE Involvement:
Track Chair | Author | Editor
Area of Expertise:
MEMS , Reliability , DMD
Websites:
Company Website
Profile Summary
Mike Douglass is a distinguished member of the technical staff at Texas Instruments. He has been a reliability engineer with TI since 1979 and has worked on a variety of programs ranging from defense systems to commercial navigation equipment. In 1992, he joined DLP® Products to support reliability development of the Digital Micromirror Device (DMD) and DLP technology. Mike received the Bachelor of Science degree in electrical engineering from the University of Connecticut (1979) and an MBA from the University of Dallas (1985).

He is a senior member of the IEEE Reliability Society, a senior member of SPIE and is a registered professional engineer in the state of Texas.
Publications (5)
Proceedings Article | 9 March 2022 Presentation
Tribute to Roland Höfling
Proceedings Volume PC12014, PC1201405 (2022) https://doi.org/10.1117/12.2631796
Proceedings Article | 2 March 2022 Presentation + Paper
Reliability assessment of the Texas Instruments phase light modulator
Proceedings Volume 12014, 1201405 (2022) https://doi.org/10.1117/12.2612227
KEYWORDS: Mirrors, Digital micromirror devices, Reliability, Modulators, Microopto electromechanical systems, Image processing, Packaging, Microelectromechanical systems, Phase modulation, Spatial light modulators
Proceedings Article | 19 February 2008 Paper
MEMS reliability: coming of age
Proceedings Volume 6884, 688402 (2008) https://doi.org/10.1117/12.791010
KEYWORDS: Reliability, Microelectromechanical systems, Digital micromirror devices, Manufacturing, Accelerated life testing, Mirrors, Digital Light Processing, Semiconductors, Inkjet technology, Microopto electromechanical systems
Proceedings Article | 16 January 2003 Paper
Burn-in test reduction for the digital micromirror device (DMD)
Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.478211
KEYWORDS: Digital micromirror devices, Mirrors, Reliability, Digital Light Processing, Semiconductors, Microelectromechanical systems, Projection systems, Manufacturing, Micromirrors, Particles
Proceedings Article | 16 January 2003 Open Access Paper
DMD reliability: a MEMS success story
Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.478212
KEYWORDS: Digital micromirror devices, Mirrors, Reliability, Projection systems, Microelectromechanical systems, Failure analysis, Image quality, Digital Light Processing, Televisions, LCDs
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Proceedings Volume Editor (11)
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Conference Committee Involvement (17)
Emerging Digital Micromirror Device Based Systems and Applications XVI
30 January 2024 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications XV
30 January 2023 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications XIV
25 January 2022 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications XIII
6 March 2021 | Online Only, California, United States
Emerging Digital Micromirror Device Based Systems and Applications XII
4 February 2020 | San Francisco, California, United States
Showing 5 of 17 Conference Committees
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