Dr. Michael R. Kellman
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 5 March 2021 Presentation
Proceedings Volume 11653, 116530R (2021) https://doi.org/10.1117/12.2577318
KEYWORDS: Phase contrast, Calibration, Microscopy, 3D metrology, Microscopes, Refractive index, 3D image processing, Tomography, Statistical analysis

Proceedings Article | 11 March 2020 Presentation
Proceedings Volume 11249, 1124916 (2020) https://doi.org/10.1117/12.2544345
KEYWORDS: Computational imaging, Imaging systems, Computing systems, Temporal resolution, Light emitting diodes, Microscopy, Diffraction, 3D image processing, 3D metrology, Refractive index

Proceedings Article | 9 March 2020 Presentation
Proceedings Volume 11245, 112450N (2020) https://doi.org/10.1117/12.2545041
KEYWORDS: Luminescence, Deconvolution, Convolutional neural networks, Machine learning, Microscopes, Machine vision, Computer vision technology, Pattern recognition

Proceedings Article | 9 March 2020 Presentation
Proceedings Volume 11245, 112450X (2020) https://doi.org/10.1117/12.2543402
KEYWORDS: 3D metrology, 3D modeling, Refractive index, Microscopy, 3D image processing, Stereoscopy, Algorithm development, Spatial light modulators, Phase imaging, Machine learning

Proceedings Article | 15 May 2018 Presentation
Proceedings Volume 10669, 106690D (2018) https://doi.org/10.1117/12.2300100
KEYWORDS: Phase imaging, Motion measurement, Phase retrieval, Phase measurement, Image registration, Motion estimation, Microscopy, Phase contrast, Transmittance, Temporal resolution

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top