X-ray phase imaging with grating interferometers, such as the Talbot interferometer, is widely performed even with a laboratory X-ray source. However, the achievable spatial resolution is normally limited by the period of gratings. In this work, two laboratory-based apparatuses are developed to overcome the constraint of the spatial resolution. One is the combination of a commercially available FZP-based X-ray imaging microscope and Lau interferometer optics. The two-step deconvolution approach is explained to attain phase tomography. The other is a sub-period super-resolution X-ray phase imaging, which is based on the sample-scanning scheme across the beamlet array formed by a triangular phase grating. A proof-of-concept result of the super-resolution approach is presented.
The phase imaging has a higher sensitivity for low-Z materials than conventional absorption imaging. We have developed a high-resolution X-ray phase microscope in combination with a Lau interferometer and used it for phase tomography. However, an existing method cannot avoid artifacts originating from the assumption of a two-beam interference model. In this study, we take a three-wave interference model into account to reduce the artifacts and propose a new method to attain phase tomography. In the presentation, we will demonstrate the reduction of the artifacts with the results of phase tomography.
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