Mitsuhiro Hatada
at Waseda Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 December 2002 Paper
Mitsuhiro Hatada, Toshiyuki Sakai, Naohisa Komatsu, Yasushi Yamazaki
Proceedings Volume 4861, (2002) https://doi.org/10.1117/12.455620
KEYWORDS: Digital watermarking, Signal to noise ratio, Wavelets, Quantization, Distance measurement, Databases, Quality testing methods, Internet, Multimedia, Process modeling

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