Nicolas Beraud
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 24 August 2024 Presentation
Nicolas Gorius, Alessio Aboudan, Matthias Ammler-von Eiff, Paolo Apollonio, Thierry Appourchaux, Claudio Arena, Natalia Auricchio, Ann Baeke, Andrea Balestra, Nicolas Beraud, Ricardo Bolt, Elisa Borreguero, Francesco Borsa, Daniele Brienza, Andrea Busatta, Juan Cabrera, Flavia Calderone, Giacomo Cherchi, Simonetta Chinellato, Fabrizio Cogato, Mathieu Condamin, Fernando Conde, Andrea Cottinelli, Giacomo Dinuzzi, Cydalise Dumesnil, Philipp Eigmüller, Lucía Espinosa, Jacopo Farinato, Lorenza Ferrari, Serge François, Maria Fürmetz, Andrea Galbiati, Sena Gomashie, Nathalie Gorter, Duncan Goulty, Davide Greggio, Denis Grießbach, Sascha Grziwa, Pierre Guiot, Pierre Guiton, Aline Hermans, Véronique Hervier, Joseph Huesler, Robert Huisman, Rik Huygen, Thomas Kanitz, Tim van Kempen, Tom Kennedy, Wouter Laauwen, François Langlet, Jean-Christophe Le Clech, Yves Levillain, Lionel Lourit, Sean Madden, Demetrio Magrin, Cesar Martin, Alexandra Mazzoli, Guillermo Mercant, Michiel Min, Rayene Missi, Francesca Molendini, Francisco Montoro, Matteo Munari, Gianalfredo Nicolini, Jarno Panman, Carsten Paproth, Martin Pertenais, Roberto Ragazzoni, Gonzalo Ramos Zapata, Sara Regibo, Maria Teresa Rodrigo, Pierre Royer, Jesus Saiz, Amaia Santiago, Francesco Santoli, Maria Ángeles Sierra, Heino Smit, Alan Smith, Guilhem Terrasa, Giovanni Tropea, Luca Valenziano, Ángel Valverde, Erik van der Meer, Bart Vandenbussche, Willem Jan Vreeling, Dave Walton, Pierre-Amaury Westphal, Romain Zida, Jose Lorenzo Alvarez, Miguel Mas-Hesse, Isabella Pagano, Heike Rauer
Proceedings Volume 13092, 1309216 (2024) https://doi.org/10.1117/12.3020454

SPIE Journal Paper | 15 March 2024
Khalil Hachem, Yann Quinsat, Christophe Tournier, Nicolas Béraud
JEI, Vol. 33, Issue 03, 031206, (March 2024) https://doi.org/10.1117/12.10.1117/1.JEI.33.3.031206
KEYWORDS: Calibration, Cameras, 3D modeling, 3D image processing, Speckle pattern, Additive manufacturing, Manufacturing, Deformation, 3D projection, Matrices

Proceedings Article | 28 July 2023 Paper
Khalil Hachem, Yann Quinsat, Christophe Tournier, Nicolas Beraud
Proceedings Volume 12749, 1274905 (2023) https://doi.org/10.1117/12.2688499
KEYWORDS: Calibration, Speckle pattern, Additive manufacturing, Manufacturing, Cameras, Image analysis, Deformation, Autocorrelation, Amplitude modulation, Speckle, Defect detection, Modal decomposition, Digital image correlation, Modal analysis

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