Matching accelerated test results to field observations is an important objective in the photovoltaic industry. We continue to develop test methods to strengthen correlations. We have previously reported good correlation of FTIR spectra between accelerated tests and field measurements. The availability of portable FTIR spectrometers has made measurement in the field convenient and reliable. Recently, nano-indentation has shown promise to correlate changes in backsheet mechanical properties. A precisely shaped stylus is pressed into a sample, load vs displacement recorded and mechanical properties of interest calculated in a nondestructive test. This test can be done on full size modules, allowing area variations in mechanical properties to be recorded. Finally, we will discuss optical profilometry. In this technique a white light interferogram of a surface is Fourier transformed to produce a three-dimensional image. Height differences from 1 nm to 5 mm can be detected over an area of a few cm. This technique can be used on minimodules, and is useful to determine crack and defect dimensions. Results will be presented correlating accelerated tests with fielded modules covering spectroscopic, mechanical, and morphological changes.
Polymeric backsheets are an important component affecting the performance and durability of photovoltaic modules. The optical properties of the backsheet should be considered in the design and performance of a photovoltaic module and the stability and durability of optical properties have an impact on power, safety and appearance. Changes in optical properties in fielded modules and accelerated durability testing are compared. IR analysis was conducted on various backsheet materials in accelerated durability testing and compared to outdoor performance to better understand the relevant chemical changes and associated degradation mechanisms. The connection between optical properties and chemical changes is discussed.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.